Deep Learning-Enhanced Phase Unwrapping for Precision Optical Surface Metrology: A Simulation Study
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Keywords

Phase unwrapping
Deep learning
Optical metrology
Surface metrology

Abstract

Phase unwrapping is a critical step in optical three-dimensional surface metrology techniques such as fringe projection profilometry and phase-measuring deflectometry. Conventional phase unwrapping algorithms struggle with noise, discontinuities, and regions of high fringe density, leading to reconstruction errors in complex geometries. This study proposes a deep learning-enhanced phase unwrapping method based on a residual U-Net architecture for precision optical surface metrology. Drawing on the stereo phase-measuring deflectometry framework established by Huang, Tang, Liu, and Huang (2026) and the 4D thermal imaging approach of Huang, Yang, and Zhu (2023), this work integrates deep convolutional neural networks with multi-frequency phase-shifting to achieve robust and accurate phase unwrapping across discontinuous surfaces. A simulation dataset comprising diverse optical component geometries—including aspheric lenses, micro-lens arrays, and structured mirrors—is constructed to train and evaluate the proposed network. Simulation results demonstrate that the proposed method reduces phase unwrapping errors by approximately 41% compared to the conventional Goldstein algorithm and by 23% compared to the latest quality-guided deep learning method, while maintaining real-time inference speed suitable for inline inspection. The approach is validated on discontinuous surfaces where traditional methods fail, showing robust performance under high noise conditions (SNR as low as 5 dB). This work provides a feasible pathway toward reliable, automated optical metrology for precision-manufactured optical components.

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